Title :
Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis
Author :
Jeynes, Chris ; Zoppi, Guillaume ; Forbes, Ian ; Bailey, Melanie J. ; Peng, Nianhua
Author_Institution :
Ion Beam Centre, Univ. of Surrey, Guildford, UK
Abstract :
There are many technical challenges in the fabrication of devices from novel materials. The characterization of these materials is critical in the development of efficient photovoltaic systems. We show how the application of recent advances in MeV IBA, providing the self-consistent treatment of RBS (Rutherford backscattering) and PIXE (particle induced X-ray emission) spectra, makes a new set of powerful complementary depth profiling techniques available for all thin film technologies, including the chalcopyrite compound semiconductors. We will give and discuss a detailed analysis of a CuInAl metallic precursor film, showing how similar methods are also applicable to other films of interest.
Keywords :
Rutherford backscattering; X-ray chemical analysis; aluminium alloys; copper alloys; indium alloys; ion beam applications; ion microprobe analysis; photovoltaic cells; photovoltaic effects; semiconductor thin films; solar cells; CuInAl; PIXE spectra; Rutherford backscattering; chalcopyrite compound semiconductors; depth profiling; ion beam analysis; particle induced X-ray emission spectra; photovoltaic systems; thin film chalcogenide PV materials; Backscatter; Ion beams; Mass spectroscopy; Photonic band gap; Photovoltaic cells; Photovoltaic systems; Scanning electron microscopy; Semiconductor films; Thin film devices; Transistors; Ion beam applications; Materials science and technology; Photovoltaic cell materials; Semiconductor films; Thin film devices;
Conference_Titel :
Sustainable Power Generation and Supply, 2009. SUPERGEN '09. International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-4934-7
DOI :
10.1109/SUPERGEN.2009.5348162
