DocumentCode
2602308
Title
First evidence for injection statistics accuracy limitations in NAND Flash constant-current Fowler-Nordheim programming
Author
Compagnoni, C. Monzio ; Spinelli, A.S. ; Gusmeroli, R. ; Lacaita, A.L. ; Beltrami, S. ; Ghetti, A. ; Visconti, A.
Author_Institution
Politecnico di Milano, Milano
fYear
2007
fDate
10-12 Dec. 2007
Firstpage
165
Lastpage
168
Abstract
We present for the first time the direct evidence of an injection statistical spread in the number of electrons placed into the floating-gate of deeply-scaled NAND Flash memories during constant-current Fowler-Nordheim programming. The spread directly affects the precision of the programmed levels and sets the ultimate accuracy of the NAND programming algorithm. Experimental results on technology nodes ranging from 90 nm to 60 nm reveal that the injection statistical spread increases as cell dimensions are reduced and this introduces a new constraint for future NAND memories design.
Keywords
flash memories; NAND flash memories; constant-current Fowler-Nordheim programming; injection statistical spread; Capacitance; Character generation; Convergence; Current measurement; Displays; Electrons; Flash memory; Nonvolatile memory; Statistics; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location
Washington, DC
Print_ISBN
978-1-4244-1507-6
Electronic_ISBN
978-1-4244-1508-3
Type
conf
DOI
10.1109/IEDM.2007.4418892
Filename
4418892
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