• DocumentCode
    2602308
  • Title

    First evidence for injection statistics accuracy limitations in NAND Flash constant-current Fowler-Nordheim programming

  • Author

    Compagnoni, C. Monzio ; Spinelli, A.S. ; Gusmeroli, R. ; Lacaita, A.L. ; Beltrami, S. ; Ghetti, A. ; Visconti, A.

  • Author_Institution
    Politecnico di Milano, Milano
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    165
  • Lastpage
    168
  • Abstract
    We present for the first time the direct evidence of an injection statistical spread in the number of electrons placed into the floating-gate of deeply-scaled NAND Flash memories during constant-current Fowler-Nordheim programming. The spread directly affects the precision of the programmed levels and sets the ultimate accuracy of the NAND programming algorithm. Experimental results on technology nodes ranging from 90 nm to 60 nm reveal that the injection statistical spread increases as cell dimensions are reduced and this introduces a new constraint for future NAND memories design.
  • Keywords
    flash memories; NAND flash memories; constant-current Fowler-Nordheim programming; injection statistical spread; Capacitance; Character generation; Convergence; Current measurement; Displays; Electrons; Flash memory; Nonvolatile memory; Statistics; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2007. IEDM 2007. IEEE International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1507-6
  • Electronic_ISBN
    978-1-4244-1508-3
  • Type

    conf

  • DOI
    10.1109/IEDM.2007.4418892
  • Filename
    4418892