Title :
A Survey of Radiation-Induced Perturbations in Metal-Insulator-Semiconductor Structures
Author_Institution :
Naval Research Laboratory, Washington, D. C. 20390
Keywords :
Degradation; Dielectric materials; Dielectrics and electrical insulation; Interface states; MIS devices; Metal-insulator structures; Radiation effects; Silicon compounds; Space charge; Threshold voltage;
Conference_Titel :
Reliability Physics Symposium, 1971. 9th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1971.362488
