• DocumentCode
    2602379
  • Title

    A Survey of Radiation-Induced Perturbations in Metal-Insulator-Semiconductor Structures

  • Author

    Hughes, H.L.

  • Author_Institution
    Naval Research Laboratory, Washington, D. C. 20390
  • fYear
    1971
  • fDate
    25993
  • Firstpage
    33
  • Lastpage
    39
  • Keywords
    Degradation; Dielectric materials; Dielectrics and electrical insulation; Interface states; MIS devices; Metal-insulator structures; Radiation effects; Silicon compounds; Space charge; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1971. 9th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1971.362488
  • Filename
    4207857
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2602379