DocumentCode :
2602386
Title :
Reliable Systems Operation of Amorphous Semiconductor Memories
Author :
Nelson, D.L. ; Shanks, R.R. ; Vanlandingham, K.E. ; Helbers, J.H.
Author_Institution :
Energy Conversion Devices, Troy, Michigan
fYear :
1971
fDate :
25993
Firstpage :
40
Lastpage :
40
Keywords :
Amorphous semiconductors; Energy conversion; Semiconductor device reliability; Switches; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1971. 9th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1971.362489
Filename :
4207858
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2602386
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