DocumentCode

2602450

Title

Reliability Studies of MOS Si-Gate Arrays

Author

Fitzgerald, D.J. ; Parker, G.H. ; Spiegel, P.

Author_Institution

Intel Corporation, Mountain View, California

fYear

1971

fDate

25993

Firstpage

57

Lastpage

61

Keywords

Circuits; Current measurement; Decoding; PROM; Packaging; Power dissipation; Stress; Temperature; Time measurement; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1971. 9th Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1971.362492

Filename

4207861