DocumentCode

2602474

Title

The Analysis of Data from Accelerated Stress Tests

Author

Peck, D.S.

Author_Institution

Bell Telephone Laboratories, Allentown, Pennsylvania

fYear

1971

fDate

25993

Firstpage

69

Lastpage

78

Keywords

Acceleration; Data analysis; Data handling; Failure analysis; Life estimation; Life testing; Semiconductor device testing; Silicon; Stress; Surface treatment;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1971. 9th Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1971.362495

Filename

4207864