DocumentCode
2602489
Title
Some Circuit Considerations and Operating Precautions for Accelerated HTRB and Operating Testing of Semiconductor Devices
Author
Zierdt, C.H., Jr.
Author_Institution
Bell Telephone Laboratories, Allentown, Pennsylvania
fYear
1971
fDate
25993
Firstpage
79
Lastpage
83
Keywords
Acceleration; Aging; Circuit testing; Life estimation; Life testing; Semiconductor device testing; Semiconductor devices; Stress; Temperature distribution; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1971. 9th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1971.362496
Filename
4207865
Link To Document