Title :
Some Circuit Considerations and Operating Precautions for Accelerated HTRB and Operating Testing of Semiconductor Devices
Author :
Zierdt, C.H., Jr.
Author_Institution :
Bell Telephone Laboratories, Allentown, Pennsylvania
Keywords :
Acceleration; Aging; Circuit testing; Life estimation; Life testing; Semiconductor device testing; Semiconductor devices; Stress; Temperature distribution; Voltage;
Conference_Titel :
Reliability Physics Symposium, 1971. 9th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1971.362496
