Title :
Design Limits When using Gold-Aluminum Bonds
Author :
Philofsky, Elliott
Author_Institution :
Motorola Inc., Semiconductor Products Division, Central Research Laboratories, Phoenix, Arizona 85008
Abstract :
Gold-aluminum wire bonds form intermetallic phases with any elevated temperature treatment. Intermetallic formation alone does not cause bond failure. However, certain failure modes--open metallization in the bond area, lifted wire bonds after aging, and heel breaks after thermal cycling--may be related to intermetallic formation. Specific causes of these failure modes are discussed. These form the basis for the recommendations presented as design limits when using gold-aluminum wire bonds in circuits.
Keywords :
Aging; Aluminum; Circuits; Geometry; Gold; Intermetallic; Laboratories; Metallization; Temperature distribution; Wire;
Conference_Titel :
Reliability Physics Symposium, 1971. 9th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1971.362502