DocumentCode
2602587
Title
Design Limits When using Gold-Aluminum Bonds
Author
Philofsky, Elliott
Author_Institution
Motorola Inc., Semiconductor Products Division, Central Research Laboratories, Phoenix, Arizona 85008
fYear
1971
fDate
25993
Firstpage
114
Lastpage
119
Abstract
Gold-aluminum wire bonds form intermetallic phases with any elevated temperature treatment. Intermetallic formation alone does not cause bond failure. However, certain failure modes--open metallization in the bond area, lifted wire bonds after aging, and heel breaks after thermal cycling--may be related to intermetallic formation. Specific causes of these failure modes are discussed. These form the basis for the recommendations presented as design limits when using gold-aluminum wire bonds in circuits.
Keywords
Aging; Aluminum; Circuits; Geometry; Gold; Intermetallic; Laboratories; Metallization; Temperature distribution; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1971. 9th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1971.362502
Filename
4207871
Link To Document