• DocumentCode
    2602587
  • Title

    Design Limits When using Gold-Aluminum Bonds

  • Author

    Philofsky, Elliott

  • Author_Institution
    Motorola Inc., Semiconductor Products Division, Central Research Laboratories, Phoenix, Arizona 85008
  • fYear
    1971
  • fDate
    25993
  • Firstpage
    114
  • Lastpage
    119
  • Abstract
    Gold-aluminum wire bonds form intermetallic phases with any elevated temperature treatment. Intermetallic formation alone does not cause bond failure. However, certain failure modes--open metallization in the bond area, lifted wire bonds after aging, and heel breaks after thermal cycling--may be related to intermetallic formation. Specific causes of these failure modes are discussed. These form the basis for the recommendations presented as design limits when using gold-aluminum wire bonds in circuits.
  • Keywords
    Aging; Aluminum; Circuits; Geometry; Gold; Intermetallic; Laboratories; Metallization; Temperature distribution; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1971. 9th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1971.362502
  • Filename
    4207871