Title :
Spectral relations of supply noise and jitter with regular and feed forward clocking schemes
Author_Institution :
Intel Corp., Haifa, Israel
Abstract :
High frequency supply noise affects chip performance in mechanisms that go beyond logic path failures due to voltage drops. One of the dominant chip performance degradation mechanisms due to high frequency noise is the direct introduction of clock jitter. Basic modeling studies powered by Fourier analysis help establish a clear and fundamental understanding of how noise is translated into jitter in the clock distribution path. In this context oscillator feed forward mechanism is also explored and analysis of its spectral response reveals how, once tuned properly, it benefits frequency boost.
Keywords :
Fourier analysis; clocks; feedforward; jitter; Fourier analysis; clock distribution path; clock jitter; context oscillator feed forward mechanism; dominant chip performance degradation; feed forward clocking schemes; high frequency noise; logic path failures; spectral relations; supply noise; voltage drops; Bandwidth; Clocks; Delay; Feeds; Integrated circuit modeling; Jitter; Noise; clock distribution; feed forward; jitter; noise;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2011 IEEE 20th Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-9398-2
Electronic_ISBN :
pending
DOI :
10.1109/EPEPS.2011.6100186