DocumentCode :
26027
Title :
Polarization-Induced Electric Fields Make Robust n-GaN/i-InGaN/p-GaN Solar Cells
Author :
Dickerson, J.R. ; Pantzas, K. ; Ougazzaden, A. ; Voss, P.L.
Author_Institution :
Georgia Tech Lorraine, Metz, France
Volume :
34
Issue :
3
fYear :
2013
fDate :
Mar-13
Firstpage :
363
Lastpage :
365
Abstract :
We study n-GaN/i-InGaN/p-GaN solar cells on Ga-face substrates. We find that polarization charges at the heterointerfaces pin the value of VOC, JSC, and the fill factor to nearly optimal levels when the InGaN layer thickness exceeds a value dmin, even as the p- and n-layer thicknesses and doping concentrations vary widely. We verify an analytical approximation for dmin. We report nearly undiminished performance when an i-GaN setback layer is added between a p-doped layer and the i-InGaN layer - an addition that may be necessary to obtain good quality heterointerfaces. Additionally, the 2-D electron gas formed at the n-GaN/i-InGaN interface facilitates thinner n-GaN window layers for improved external quantum efficiency.
Keywords :
III-V semiconductors; approximation theory; gallium compounds; indium compounds; polarisation; semiconductor doping; solar cells; two-dimensional electron gas; wide band gap semiconductors; 2-D electron gas formation; GaN-InGaN-GaN; analytical approximation; doping concentration; fill factor; heterointerface pin; improved external quantum efficiency; n-layer thickness; p- layer thickness; p-doped layer; polarization charge; polarization-induced electric field; setback layer; solar cell; Doping; Gallium nitride; HEMTs; MODFETs; Performance evaluation; Photovoltaic cells; Two dimensional hole gas; InGaN; photovoltaic cells; polarization; solar cell;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2012.2237376
Filename :
6419758
Link To Document :
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