Title :
A new hybrid FDTD field-teleportation approach for modeling radiating/scattering structures
Author :
Scherbatko, I. ; Diaz, R.
Author_Institution :
Arizona State University, Department of Electrical Engineering, Tempe, AZ 85281, USA
Abstract :
The essence of the technique, called Field Teleportation, is to invoke the principle of equivalent sources (Schelkunoff´s currents) using FDTD´s discrete definition of the curl to copy any field propagating in one FDTD domain to a finite region of another domain without distortion [1]. Here an approach to teleport a frequency domain field into FDTD domain has been successfully tested for realistic large objeet scattering problem. The teleported field is used in FDTD to illuminate a scattering object introduced into the test region and the time-domain scattered signal has been transformed back into the frequency domain as induced equivalent surface currents. Having these currents, calculation of the farfield scattering becomes a trivial procedure. For the case of an exact frequency-domain solution, the error introduced by field-teleportation for 5λ 5λ by 2λ modeled space with PEC boundary is less than -110 dB and the phase error is less than 0.16 degree. For the case of field obtained by Uuiform Theory of Diffraction (UTD) on condense grid, intrinsic error has not exceeded -60 dB in magnitnde and ±3 degree in phase. In this case main e m r caused by H-field retrieving from E-field on condensed (non-Yee) grid. Our modeling shows high importance of the grid matching between any frequency domain method and FDTD (E and H-field components have to he found on Yee-grid for the hest field teleportation).
Keywords :
Apertures; Diakoptics; Electromagnetic scattering; Finite difference methods; Frequency domain analysis; Joining processes; Physical theory of diffraction; Teleportation; Testing; Time domain analysis;
Conference_Titel :
Mathematical Methods in Electromagnetic Theory, 2004. 10th International Conference on
Conference_Location :
Dniepropetrovsk, Ukraine
Print_ISBN :
0-7803-8441-5
DOI :
10.1109/MMET.2004.1396922