DocumentCode
2603089
Title
EM methods for variability analysis (W-III)
Author
Kim, Joungho ; Wu, Tzong-Lin
Author_Institution
KAIST, Korea
fYear
2011
fDate
23-26 Oct. 2011
Firstpage
151
Lastpage
152
Abstract
Start of the above-titled section of the conference proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2011 IEEE 20th Conference on
Conference_Location
San Jose, CA
ISSN
pending
Print_ISBN
978-1-4244-9398-2
Electronic_ISBN
pending
Type
conf
DOI
10.1109/EPEPS.2011.6100212
Filename
6100212
Link To Document