Title :
Random rough surface effects in interconnects studied by small perturbation theory in waveguide model
Author :
Ding, Ruihua ; Tsang, Leung ; Braunisch, Henning
Author_Institution :
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
Abstract :
We study the effects of random roughness on wave propagation in a parallel plate metallic waveguide with finite conductivity. The rough surface is three dimensional (3D) with roughness heights varying in both horizontal directions. Integral equations are obtained from the extinction theorem formulated with layered medium Green´s function. The second order small perturbation method is then applied to solve the integral equations. A closed form expression for the coherent wave is derived, which is expressed in terms of a three-fold Sommerfeld type integral due to the waveguide structure. Approximate methods are applied to calculate the Sommerfeld integral. The coherent wave enhancement factors of absorption are computed. The results for waveguides are also compared with the results obtained for a plane wave incident on a metal surface with 3D roughness. Results are illustrated for 3D roughness with a variety of power spectra. It is shown that enhancement factors for a waveguide are larger than that of the plane wave case.
Keywords :
Green´s function methods; approximation theory; electromagnetic wave scattering; integral equations; perturbation theory; surface roughness; Green´s function; approximate methods; closed form expression; extinction theorem; finite conductivity; integral equations; parallel plate metallic waveguide; perturbation theory; random rough surface effects; random roughness; three-fold Sommerfeld type integral; wave propagation; waveguide model; Planar waveguides; Rough surfaces; Solid modeling; Surface roughness; Surface waves; Three dimensional displays; Random rough surface; enhancement factor; perturbation method; three dimensional; waveguide structure;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2011 IEEE 20th Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-9398-2
Electronic_ISBN :
pending
DOI :
10.1109/EPEPS.2011.6100215