DocumentCode :
2603213
Title :
Degradation Analysis of Infrared and Visible Optoelectronics Devices
Author :
Lebailly, J. ; Gouin, C. ; Desombre, A.
Author_Institution :
R.T.C LA RADIOTECHNIQUE-COMPELEC, 14 -CAEN ( FRANCE )
fYear :
1972
fDate :
26390
Firstpage :
126
Lastpage :
136
Keywords :
Aging; Capacitive sensors; Degradation; Diodes; Electroluminescence; Electroluminescent devices; Gallium arsenide; Gold; Optoelectronic devices; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1972. 10th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1972.362540
Filename :
4207912
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2603213
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