Title :
The Effects of Device Configuration in the Degradation of GaP Red Light-Emitting Diodes
Author :
Hartman, R.L. ; Kuhn, M.
Author_Institution :
Bell Laboratories, Murray Hill, New Jersey 07974
Abstract :
Two components are observed in the degradation of GaP LED´s. We show that the rapid initial component is related to device configuration. This can be minimized by suitable choice of device geometry, significantly improving useful LED life. Consequently, the anomalous (n > 2) current component after degradation is eliminated, allowing a quantitative understanding of degradation.
Keywords :
Aging; Capacitive sensors; Current density; Degradation; Geometry; Gold; Light emitting diodes; Luminescence; Passivation; Surface contamination;
Conference_Titel :
Reliability Physics Symposium, 1972. 10th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1972.362541
