• DocumentCode
    2603415
  • Title

    Common-mode noise reduction schemes for differential serpentine delay microstrip line in high-speed digital circuits

  • Author

    Shiue, Guang-Hwa ; Tsai, Yi-Chin ; Hsu, Che-Ming ; Shiu, Jia-Hung

  • Author_Institution
    Dept. of Electron. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
  • fYear
    2011
  • fDate
    23-26 Oct. 2011
  • Firstpage
    211
  • Lastpage
    214
  • Abstract
    This work proposes two noise reduction schemes that use strongly coupled vertical-turn traces as substitute for weakly coupled vertical-turn traces and added guard traces to reduce the common-mode noise in a weakly differential serpentine delay microstrip line. The peak-to-peak amplitude of common-mode noise in the time-domain is reduced by bout 65% using the two methods, according to simulation results. The simulation results demonstrate that the frequency range over which the magnitude of differential-to-common mode conversion is reduced for a differential serpentine delay line with is wide band in the range 0.1~2.7 GHz and 3.2~10 GHz. Furthermore, the differential reflection loss for additional guard traces is only slightly reduced at the frequency of interest, but when strongly coupled vertical- turn traces are used. However, the differential insertion loss achieved using the two improved schemes is almost the same as that of the traditional pattern.
  • Keywords
    circuit noise; delay circuits; microstrip circuits; added guard traces; common mode noise reduction schemes; coupled vertical turn traces; differential insertion loss; differential serpentine delay microstrip line; high speed digital circuits; peak to peak amplitude; reflection loss; Delay; Ear; Impedance; Substrates; Time frequency analysis; common-mode noise; differential serpentine delay line; differential-to-common mode conversion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2011 IEEE 20th Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    pending
  • Print_ISBN
    978-1-4244-9398-2
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/EPEPS.2011.6100229
  • Filename
    6100229