Awards

Summary form only given, as follows. The IEEE Reliability Physics Symposium Award for Outstanding Contributions to the field of Reliability Physics was authorized by vote of the Syrriposium Board of Directors. This award, which is not necessarily given annually, is to be presented to individuals who, by their work, have made major significant contributions to the advancement of the field of reliability. The 1973 Award was presented to Joseph Vaccaro of the Rome Air Development Center, US Air Force, in recognition of his pioneering efforts in the field of Reliability Physics-for his early recognition of the need for a fresh approach to semiconductor device reliability, based upon an understanding of the physical and chemical basis for device degradation and failure: for his unflagging dedication and continued participation in this series of Symposia, starting with his presentation of the first technical paper at the initial meeting in 1962, and for his establishment of the first extensive US Department of Defense (DoD) failure analysis laboratory for semiconductor devices, which has set the pattern for those which followed, both here and abroad.