2603510

Cost-effective approach for reducing soft error failure rate in logic circuits

Mohanram, Kartik ; Touba, Nur A.

University of Texas at Austin

1

2003

Sept. 30-Oct. 2, 2003

893

901

Circuit faults; Computer errors; Concurrent computing; Costs; Error correction codes; Integrated circuit noise; Latches; Logic circuits; Mission critical systems; Single event upset;

English

ieee

Test Conference, 2003. Proceedings. ITC 2003. International

1089-3539

0-7803-8106-8

conf

10.1109/TEST.2003.1271075

1271075