DocumentCode :
2603520
Title :
Intermetallic Characterization
Author :
Zakraysek, Louis
Author_Institution :
Manager, Applied Materials & Processes, General Electric Company, Syracuse, New York 13201
fYear :
1973
fDate :
26755
Firstpage :
6
Lastpage :
9
Abstract :
This is a study of bonding methods used in electronic component fabrication. One result is the formation of dynamic intermediate alloys that exhibit continual change toward an ultimate equilibrium condition. Microstructural changes are influenced by time, temperature, matrix materials, alloying elements, impurities and contaminants. The limiting strength of the bond is determined to a major extent by the conditions existent at the leading edge of the intermetallic layer as it grows into the host matrix. Characteristic growth patterns may provide the insight to a better understanding of this bonding mechanism.
Keywords :
Bonding; Copper; Failure analysis; Integrated circuit interconnections; Intermetallic; Lead; Microstructure; Morphology; Soldering; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1973. 11th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1973.362560
Filename :
4207935
Link To Document :
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