• DocumentCode
    2603520
  • Title

    Intermetallic Characterization

  • Author

    Zakraysek, Louis

  • Author_Institution
    Manager, Applied Materials & Processes, General Electric Company, Syracuse, New York 13201
  • fYear
    1973
  • fDate
    26755
  • Firstpage
    6
  • Lastpage
    9
  • Abstract
    This is a study of bonding methods used in electronic component fabrication. One result is the formation of dynamic intermediate alloys that exhibit continual change toward an ultimate equilibrium condition. Microstructural changes are influenced by time, temperature, matrix materials, alloying elements, impurities and contaminants. The limiting strength of the bond is determined to a major extent by the conditions existent at the leading edge of the intermetallic layer as it grows into the host matrix. Characteristic growth patterns may provide the insight to a better understanding of this bonding mechanism.
  • Keywords
    Bonding; Copper; Failure analysis; Integrated circuit interconnections; Intermetallic; Lead; Microstructure; Morphology; Soldering; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1973. 11th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1973.362560
  • Filename
    4207935