DocumentCode
2603520
Title
Intermetallic Characterization
Author
Zakraysek, Louis
Author_Institution
Manager, Applied Materials & Processes, General Electric Company, Syracuse, New York 13201
fYear
1973
fDate
26755
Firstpage
6
Lastpage
9
Abstract
This is a study of bonding methods used in electronic component fabrication. One result is the formation of dynamic intermediate alloys that exhibit continual change toward an ultimate equilibrium condition. Microstructural changes are influenced by time, temperature, matrix materials, alloying elements, impurities and contaminants. The limiting strength of the bond is determined to a major extent by the conditions existent at the leading edge of the intermetallic layer as it grows into the host matrix. Characteristic growth patterns may provide the insight to a better understanding of this bonding mechanism.
Keywords
Bonding; Copper; Failure analysis; Integrated circuit interconnections; Intermetallic; Lead; Microstructure; Morphology; Soldering; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1973. 11th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1973.362560
Filename
4207935
Link To Document