Title :
On-line detection of faults in carry-select adders
Author :
Kumar, B. Kiran ; Lala, P.K.
Author_Institution :
University of Arkansas
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Adders; Arithmetic; Circuit faults; Circuit testing; Computer architecture; Computer science; Electrical fault detection; Electronic mail; Fault detection; Hardware;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271077
