Title :
Decoupling capacitor stacked chip (DCSC) in TSV-based 3D-ICs
Author :
Song, Eunseok ; Koo, Kyoungchoul ; Kim, Myunghoi ; Pak, Jun So ; Kim, Joungho
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
Abstract :
In this paper, we introduce a new decoupling capacitor stacked chip (DCSC) with discrete capacitors and through-silicon-vias (TSVs) that can overcome the limitations of the conventional decoupling capacitor solutions such as expensive on-chip NMOS capacitor and package-level discrete decoupling capacitor with narrow-band. The key idea of the proposed TSV-based DCSC is mounting the decoupling capacitors such as silicon-based NMOS capacitor and discrete capacitor on the backside of a chip and connecting the capacitors to the on-chip PDN through TSVs. Therefore, the TSV-based DCSC provides the lowest parasitic inductance (ESL: under several tens pH) through a short interconnections between the on-chip PDN and decoupling capacitors as well as the largest capacitance (up to several uF) by stacking the additional decoupling capacitors to 3D-IC systems.
Keywords :
integrated circuit interconnections; integrated circuit packaging; three-dimensional integrated circuits; TSV- based 3D-IC; decoupling capacitor stacked chip; integrated circuit interconnections; on-chip NMOS capacitor; on-chip PDN; package-level discrete decoupling capacitor; power distribution networks; through-silicon-vias; Capacitance; Capacitors; Inductance; MOS devices; System-on-a-chip; Three dimensional displays; Through-silicon vias; decoupling capacitor; power distribution network (PDN); power integrity; simultaneous switching noise (SSN); three-dimensional integrated circuit (3D IC); through-silicon-via (TSV);
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2011 IEEE 20th Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-9398-2
Electronic_ISBN :
pending
DOI :
10.1109/EPEPS.2011.6100235