• DocumentCode
    2603552
  • Title

    Decoupling capacitor stacked chip (DCSC) in TSV-based 3D-ICs

  • Author

    Song, Eunseok ; Koo, Kyoungchoul ; Kim, Myunghoi ; Pak, Jun So ; Kim, Joungho

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon, South Korea
  • fYear
    2011
  • fDate
    23-26 Oct. 2011
  • Firstpage
    235
  • Lastpage
    238
  • Abstract
    In this paper, we introduce a new decoupling capacitor stacked chip (DCSC) with discrete capacitors and through-silicon-vias (TSVs) that can overcome the limitations of the conventional decoupling capacitor solutions such as expensive on-chip NMOS capacitor and package-level discrete decoupling capacitor with narrow-band. The key idea of the proposed TSV-based DCSC is mounting the decoupling capacitors such as silicon-based NMOS capacitor and discrete capacitor on the backside of a chip and connecting the capacitors to the on-chip PDN through TSVs. Therefore, the TSV-based DCSC provides the lowest parasitic inductance (ESL: under several tens pH) through a short interconnections between the on-chip PDN and decoupling capacitors as well as the largest capacitance (up to several uF) by stacking the additional decoupling capacitors to 3D-IC systems.
  • Keywords
    integrated circuit interconnections; integrated circuit packaging; three-dimensional integrated circuits; TSV- based 3D-IC; decoupling capacitor stacked chip; integrated circuit interconnections; on-chip NMOS capacitor; on-chip PDN; package-level discrete decoupling capacitor; power distribution networks; through-silicon-vias; Capacitance; Capacitors; Inductance; MOS devices; System-on-a-chip; Three dimensional displays; Through-silicon vias; decoupling capacitor; power distribution network (PDN); power integrity; simultaneous switching noise (SSN); three-dimensional integrated circuit (3D IC); through-silicon-via (TSV);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2011 IEEE 20th Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    pending
  • Print_ISBN
    978-1-4244-9398-2
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/EPEPS.2011.6100235
  • Filename
    6100235