• DocumentCode
    2603629
  • Title

    Variable Capacitors and Tunable LC-Tanks Formed by CMOS-Compatible Metal MEMS for RF ICs

  • Author

    Gu, Lei ; Li, Xinxin

  • Author_Institution
    Chinese Acad. of Sci., Shanghai
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    427
  • Lastpage
    430
  • Abstract
    Variable capacitors are fabricated in standard silicon substrate by using a CMOS-compatible metal MEMS process. A low temperature process is implemented with two layers of mask. The suspended structure of the variable capacitor effectively depresses substrate loss, thereby, achieving both high Q-factor and high self-resonance frequency. The tunable-capacitor can be flexibly connected into an RFIC, and a rotationally driven structure is proposed and formed with anti-vibration capacity for mobile applications. By integrating the variable capacitor with a solenoid inductor, a parallel tunable LC-tank is fabricated and tested, resulting in a broad tuning-range of resonant frequency. With the low temperature post-CMOS process, the high-performance variable capacitors and LC-tanks are promising in RF ICs.
  • Keywords
    CMOS integrated circuits; capacitors; circuit tuning; inductors; micromachining; micromechanical devices; radiofrequency integrated circuits; CMOS-compatible metal MEMS process; antivibration capacity; high self-resonance frequency; low temperature postCMOS process; micromachining fabrication; on-chip variable capacitors; parallel tunable LC-tank; rotationally driven structure; solenoid inductor; substrate loss; tunable RF IC; tunable-capacitor; Capacitors; Inductors; Micromechanical devices; Q factor; Radio frequency; Radiofrequency integrated circuits; Silicon; Solenoids; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2007. IEDM 2007. IEEE International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1507-6
  • Electronic_ISBN
    978-1-4244-1508-3
  • Type

    conf

  • DOI
    10.1109/IEDM.2007.4418964
  • Filename
    4418964