A user´s view of the new MIL-STD-883 Procedure 5012

Author

Pyron, Carol ; Vining, Suzanne

Author_Institution

Texas Instrum. Inc., Plano, TX, USA

fYear

1990

fDate

17-21 Sep 1990

Firstpage

261

Lastpage

268

Abstract

The MIL-STD-883 Procedure 5012, `Fault Coverage Measurement for Digital Microcircuits´, is reviewed. Procedure 5012 specifies a standard fault set and fault coverage calculation techniques. The motivation and benefits of the standard are detailed. The effect of the standard fault set is studied by analysis and presentation of test case data. An actual example illustrates the costs of generating a compliant fault coverage report. The impact of the procedure on US Department of Defense contractors, fault simulation developers, and semiconductor vendors is discussed

Keywords

automatic test equipment; automatic testing; digital integrated circuits; electronic equipment testing; fault location; integrated circuit testing; logic testing; military equipment; military systems; standards; ASIC; MIL-STD-883; US Department of Defense; contractors; costs; digital microcircuits; fault coverage measurement; fault simulation developers; logic model; semiconductor vendors; standard fault set; Application specific integrated circuits; Automatic testing; Circuit faults; Costs; Instruments; Logic devices; Logic gates; Logic testing; Procurement; Standards development;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.

Conference_Location

San Antonio, TX

Type

conf

DOI

10.1109/AUTEST.1990.111522

Filename

111522