DocumentCode
2603667
Title
High Reproducibility and Reliability of Piezoelectric MEMS Tunable Capacitors for Reconfigurable RF Front-end
Author
Kawakubo, Tadamichi ; Nagano, Takeshi ; Nishigaki, Masakatsu ; Itaya, Kazuhiko
Author_Institution
Toshiba Research Consulting Corporation, 1, Komukai Toshiba-cho, Saiwaiku, Kawasaki, Japan
fYear
2007
fDate
10-12 Dec. 2007
Firstpage
435
Lastpage
438
Abstract
A novel RF MEMS tunable capacitor having W-shaped folded beam piezoelectric bimorph actuator using a CMOS compatible surface micromachining process has been proposed. The structure almost completely compensates the curling of the beams due to unbalanced residual stress and thermal expansion mismatch, and assures high reproducibility and negligible temperature dependence. Cyclic and static lifetime tests at as high as 9V had slight effects on the C-V characteristics. The high reproducibility and reliability assure the capacitors are promising as key components in reconfigurable RF systems, such as tunable antennas, tunable filters and tunable impedance networks.
Keywords
antennas; capacitors; micromachining; micromechanical devices; piezoelectric actuators; CMOS compatible surface micromachining process; Cyclic and static lifetime tests; RF MEMS tunable capacitor; W-shaped folded beam piezoelectric bimorph actuator; reconfigurable RF front-end; static lifetime tests; tunable antennas; tunable impedance networks; CMOS process; Capacitors; Micromachining; Micromechanical devices; Piezoelectric actuators; Radio frequency; Radiofrequency microelectromechanical systems; Reproducibility of results; Residual stresses; Thermal expansion;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location
Washington, DC
Print_ISBN
978-1-4244-1507-6
Electronic_ISBN
978-1-4244-1508-3
Type
conf
DOI
10.1109/IEDM.2007.4418966
Filename
4418966
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