Title :
Overview of the IEEE P1500 standard
Author :
Dasilva, Francisco ; Zorian, Yervant ; Whetsel, Lee ; Arabi, Karim ; Kapur, Rohit
Author_Institution :
Synopsys, Inc.
fDate :
Sept. 30 2003-Oct. 2 2003
Keywords :
Automatic testing; Design methodology; Design optimization; Hardware; IEEE standards; Instruments; Logic; Productivity; Registers;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Conference_Location :
Charlotte, NC, USA
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271086
