DocumentCode
2603720
Title
Further Studies on the Reliability of Thin-Film Nickel-Chromium Resistors
Author
Paulson, Wayne M.
Author_Institution
Senior Metallurgist, Materials Research Laboratory, Motorola, Inc., 5005 E. McDowell Road, Phoeniz, Arizona 85008
fYear
1973
fDate
26755
Firstpage
61
Lastpage
68
Abstract
The reliability of thin-film Ni-Cr resistors was studied with respect to the effects of corrosion, oxidation and interdiffusion. Water on unpassivated films resulted in anodic dissolution at potentials above 2.5 volts. Oxidation increased the resistivity and lowered the T.C.R. to 20 ppm/°C. Aluminum diffused into the NiCr with an activation energy of 96 kcal/mole.
Keywords
Anodes; Chromium; Circuit testing; Conductivity; Corrosion; Heat treatment; Materials reliability; Oxidation; Resistors; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1973. 11th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1973.362568
Filename
4207943
Link To Document