• DocumentCode
    2603740
  • Title

    Performance Analysis of Low Power Null Convention Logic Units with Power Cutoff

  • Author

    Guan, Xuguang ; Liu, Yu ; Yang, Yintang

  • Author_Institution
    Inst. of Microelectron., Xidian Univ., Xi´´an, China
  • fYear
    2010
  • fDate
    17-18 April 2010
  • Firstpage
    55
  • Lastpage
    58
  • Abstract
    Null convention logic units are the most important logic units in asynchronous circuits. This paper proposes a new realization of null convention logic unit based on semi-static threshold gates. Through adding a cutoff transistor into the pull-up path, the leakage current can be greatly decreased, which can resolve the issue of leakage current increment in deep submicron technology. Comparisons are made on delay, area, power consumption as well as working speed with the conventional logic units. One bit asynchronous adder and basic gates are realized based on the proposed null convention logic unit and comparisons are made on performance and power consumption. Results have shown that the new null convention logic unit has significant decrements in dynamic and static power consumption. Dynamic power consumption of TH33 gate has decreased by 13.6%, and 72.9% to the static power consumption. The newly design proposal can satisfy the requirement of low power asynchronous design.
  • Keywords
    adders; asynchronous circuits; logic design; logic gates; low-power electronics; TH33 gate; asynchronous adder; asynchronous circuits; asynchronous design; cutoff transistor; deep submicron technology; null convention logic units; performance analysis; power cutoff; semi-static threshold gates; Asynchronous circuits; Clocks; Delay; Encoding; Energy consumption; Leakage current; Logic circuits; Logic design; Performance analysis; Rails; asynchronous circuits; low power; null convention logic; power cutoff; threshold gates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wearable Computing Systems (APWCS), 2010 Asia-Pacific Conference on
  • Conference_Location
    Shenzhen
  • Print_ISBN
    978-1-4244-6467-8
  • Electronic_ISBN
    978-1-4244-6468-5
  • Type

    conf

  • DOI
    10.1109/APWCS.2010.21
  • Filename
    5481102