DocumentCode :
2603789
Title :
Sparse Bayesian Regression for Head Pose Estimation
Author :
Ma, Yong ; Konishi, Yoshinori ; Kinoshita, Koichi ; Lao, Shihong ; Kawade, Masato
Author_Institution :
Sensing & Control Lab., Omron Corp., Kyoto
Volume :
3
fYear :
0
fDate :
0-0 0
Firstpage :
507
Lastpage :
510
Abstract :
This paper presents a high performance head pose estimation system based on the newly-proposed sparse Bayesian regression technique (relevance vector machine, RVM) and sparse representation of facial patterns. In our system, after localizing 20 key facial points, sparse features of these points are extracted to represent facial property, and then RVM is utilized to learn the relation between the sparse representation and yaw and pitch angle. Because RVM requires only a very few kernel functions, it can guarantee better generalization, faster speed and less memory in a practical implementation. To thoroughly evaluate the performance of our system, we compare it with conventional methods such as CCA, kernel CCA, SVR on a large database; In experiments, we also investigate the influence of the facial points localization error on pose estimation by using manually labelled results and automatically localized results separately, and the influence of different features on pose estimation such as geometrical features and texture features. These experimental results demonstrate that our system can estimate face pose more accurately, robustly and fast than those based on conventional methods
Keywords :
Bayes methods; feature extraction; image motion analysis; learning (artificial intelligence); regression analysis; facial patterns; facial point localization; geometrical features; head pose estimation system; kernel functions; relevance vector machine; sparse Bayesian regression; sparse feature extraction; sparse representation; texture features; Bayesian methods; Classification tree analysis; Control systems; Estimation error; Face detection; Feature extraction; Kernel; Magnetic heads; Robustness; Spatial databases;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
Conference_Location :
Hong Kong
ISSN :
1051-4651
Print_ISBN :
0-7695-2521-0
Type :
conf
DOI :
10.1109/ICPR.2006.1067
Filename :
1699575
Link To Document :
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