2603852

Atpg padding and ate vector repeat per port for reducing test data volume

Vranken, Harald ; Hapke, Friedrich ; Rogge, Soenke ; Chindamo, Domenico ; Volkerink, Erik

Agilent Technologies

1

2003

Sept. 30-Oct. 2, 2003

1069

1078

Automatic test pattern generation; Automatic testing; Circuit testing; Clocks; Costs; Design methodology; Encoding; Integrated circuit testing; Pins; Semiconductor device testing;

English

ieee

Test Conference, 2003. Proceedings. ITC 2003. International

1089-3539

0-7803-8106-8

conf

10.1109/TEST.2003.1271095

1271095