Title :
CMOS Devices - Device/Design Interaction
Author :
Horstmann, Manfred ; Mahnkopf, Reinhard
Author_Institution :
AMD Dresden
Keywords :
CMOS technology; Circuits; Design optimization; Fluctuations; Microprocessors; National electric code; Paper technology; Random access memory; Semiconductor device modeling; Threshold voltage;
Conference_Titel :
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1507-6
Electronic_ISBN :
978-1-4244-1508-3
DOI :
10.1109/IEDM.2007.4418974