DocumentCode :
2603868
Title :
Analysis of Electrical Overstress Failures
Author :
Smith, Jack S.
Author_Institution :
Reliability Branch, Rome Air Development Center, Griffiss AFB NY 13441
fYear :
1973
fDate :
26755
Firstpage :
105
Lastpage :
107
Abstract :
Electrical overstress microcircuit failures are a major cause of equipment malfunction. Visual cues for bidentifying overstress failures are discussed. In addition means for determining the current, voltage and pulse width magnitudes of the transient pulse which caused the failure are explained.
Keywords :
Annealing; Contacts; Degradation; Electric variables; Failure analysis; Inspection; Metallization; Optical microscopy; Silicon; Space vector pulse width modulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1973. 11th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1973.362579
Filename :
4207954
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2603868
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