DocumentCode :
2603915
Title :
A case study of ir-drop in structured at-speed testing
Author :
Saxena, Jayashree ; Butler, Kenneth M. ; Jayaram, V.B. ; Kundu, Sandipan ; Arvind, N.V. ; Sreeprakash, Pravin ; Hachinger, M.
Author_Institution :
Texas Instruments Inc.
Volume :
1
fYear :
2003
fDate :
Sept. 30-Oct. 2, 2003
Firstpage :
1098
Lastpage :
1104
Keywords :
Application specific integrated circuits; Computer aided software engineering; Costs; Delay; Energy consumption; Packaging; Power dissipation; Pulp manufacturing; Test pattern generators; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN :
1089-3539
Print_ISBN :
0-7803-8106-8
Type :
conf
DOI :
10.1109/TEST.2003.1271098
Filename :
1271098
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2603915
