Title :
Backplane test bus applications EEE STD 1149.1
Author_Institution :
Texas Instruments, Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Backplanes; Circuit testing; Controllability; Integrated circuit packaging; Logic devices; Logic testing; Printed circuits; Programmable logic arrays; Programmable logic devices; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271100
