Title :
An Effective Switching Current Methodology to Predict the Performance of Complex Digital Circuits
Author :
Von Arnim, Klaus ; Pacha, Christian ; Hofmann, Karl ; Schulz, Thomas ; Schrüfer, Klaus ; Berthold, Jörg
Author_Institution :
Infineon Technol., Munich
Abstract :
A new methodology to assess dynamic circuit performance using basic device currents is presented. In contrast to existing effective drive current calculation considering inverters only, our approach provides precise circuit delays of product-relevant NAND and NOR logic gates over a wide range of supply voltages. The relevance of currents in the linear regime for circuit performance in sub-65 nm CMOS technologies is demonstrated also experimentally by a 65% performance boost in complex multi-gate FET circuits.
Keywords :
CMOS logic circuits; delay circuits; field effect transistor circuits; logic gates; CMOS technologies; NAND logic gate; NOR logic gates; circuit delays; complex digital circuits; multigate FET circuits; size 65 nm; switching current methodology; CMOS logic circuits; CMOS technology; Circuit optimization; Delay effects; Digital circuits; Logic circuits; Logic devices; Logic gates; Pulse inverters; Switching circuits;
Conference_Titel :
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1507-6
Electronic_ISBN :
978-1-4244-1508-3
DOI :
10.1109/IEDM.2007.4418979
