Title :
On the progressive breakdown statistical distribution and its voltage acceleration
Author :
Wu, Ernest ; Tous, Santi ; Suñé, Jordi
Author_Institution :
IBM Microelectron., Essex Junction
Abstract :
The statistical distribution of progressive breakdown (PBD) time is found to be lognormal at high values of failure currents in large sample size experiments. A physics-based model captures the main experimental trends. While we confirm that the voltage scaling of PBD time is nicely modelled by a power law, the value of the power-law exponent is reported to depend on the failure current and to take values somewhat smaller than those previously reported for the first breakdown voltage acceleration.
Keywords :
electric breakdown; log normal distribution; lognormal distribution; power-law exponent; progressive breakdown time; statistical distribution; voltage acceleration; voltage scaling; Acceleration; Bismuth; Breakdown voltage; Electric breakdown; Microelectronics; Predictive models; Shape; Statistical distributions; Stress; Weibull distribution;
Conference_Titel :
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1507-6
Electronic_ISBN :
978-1-4244-1508-3
DOI :
10.1109/IEDM.2007.4418982