Title :
Designing Reliable Systems with Unreliable Devices Challenges and Opportunities
Author_Institution :
DEIS Univ. di Bologna, Bologna
Abstract :
Scaling devices toward nanometer-scale dimensions is rapidly exacerbating reliability problems in large-scale integrated ICs. While power has emerged as the key challenge for CMOS integration in the first decade of the 21rst century, reliability likely raise to the level of first class design constraint in the next decade. New materials, process improvements and device engineering come to the rescue, but, as in the case of power, they are not sufficient to fully solve the problem. Hence, reliability is rapidly becoming a cross-cutting design challenge. Techniques and tools are required across the entire design flow, from circuits to software, as we must learn to build reliable systems with unreliable components. The paper focuses on hardware-centric approaches.
Keywords :
integrated circuit design; network synthesis; reliability; semiconductor technology; CMOS integration; device scaling; hardware-centric approach; nanometer-scale dimensions; reliable systems; unreliable device; Aerodynamics; Art; Degradation; Flip-flops; Hardware; High speed integrated circuits; Noise robustness; Power system reliability; Protection; Redundancy;
Conference_Titel :
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1507-6
Electronic_ISBN :
978-1-4244-1508-3
DOI :
10.1109/IEDM.2007.4418986