DocumentCode
2604096
Title
Fast quality-guided phase unwrapping algorithm for 3D profilometry based on object image edge detection
Author
Ke Chen ; Jiangtao Xi ; Yanguang Yu
Author_Institution
Sch. of Electr., Univ. of Wollongong, Wollongong, NSW, Australia
fYear
2012
fDate
16-21 June 2012
Firstpage
64
Lastpage
69
Abstract
A main challenge associated with 3-dimentional fringe pattern profilometry (3D-FPP) systems is the unwrapping of phase maps resulted from complex object surface shapes with both robustness and speed guaranteed. In this paper we propose a new quality-guided phase unwrapping algorithm. In contrast to the conventional quality-guided methods, we classify pixels on wrapped phase map into two types by detecting edge pixels on object image: high quality (HQ) pixels corresponding to smooth phase changes and low quality (LQ) ones to rough phase changes. In order to improve the computational efficiency, these two types of pixels are unwrapped by means of different approaches. That is, the HQ pixels are unwrapped by a simple path following algorithm and the LQ ones are recovered by conventional flood-fill algorithm. Experiments show that the proposed approach is able to unwrap complex phase maps with the similar accuracy performance as and much higher speed than the conventional quality-guided algorithm.
Keywords
edge detection; image classification; object detection; 3-dimentional fringe pattern profilometry; 3D-FPP systems; HQ pixels; LQ pixels; complex object surface shapes; complex phase map unwrapping; computational efficiency improvement; edge pixel detection; flood-fill algorithm; high-quality pixels; low-quality pixels; object image edge detection; path following algorithm; pixel classification; quality-guided phase unwrapping algorithm; smooth phase changes; Algorithm design and analysis; Cameras; Classification algorithms; Image edge detection; Object recognition; Robustness; Shape;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition Workshops (CVPRW), 2012 IEEE Computer Society Conference on
Conference_Location
Providence, RI
ISSN
2160-7508
Print_ISBN
978-1-4673-1611-8
Electronic_ISBN
2160-7508
Type
conf
DOI
10.1109/CVPRW.2012.6239239
Filename
6239239
Link To Document