DocumentCode :
2604104
Title :
Failure Analysis Applications of Auger Electron Spectroscopy
Author :
Gonzales, Anthony J.
Author_Institution :
Section Manager, Motorola, Inc., Materials Research Laboratory, 5005 E. McDowell Road, Phoenix, Arizona 85008
fYear :
1973
fDate :
26755
Firstpage :
185
Lastpage :
188
Abstract :
The basic operation, advantages, and limitations of the Auger electron spectroscopy technique are discussed. Applications include simultaneous surface analysis and ion sputtering to produce a compositional-depth profile. This technique is used to study the soldering problem caused by diffusion of impurities to the surface during high temperature treatments. In analyzing wire bond problems, the elemental and chemical bonding information of the Auger signals is shown to provide identification of processing defects.
Keywords :
Bonding; Chemical analysis; Electrons; Failure analysis; Impurities; Soldering; Spectroscopy; Sputtering; Surface treatment; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1973. 11th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1973.362593
Filename :
4207968
Link To Document :
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