DocumentCode
2604104
Title
Failure Analysis Applications of Auger Electron Spectroscopy
Author
Gonzales, Anthony J.
Author_Institution
Section Manager, Motorola, Inc., Materials Research Laboratory, 5005 E. McDowell Road, Phoenix, Arizona 85008
fYear
1973
fDate
26755
Firstpage
185
Lastpage
188
Abstract
The basic operation, advantages, and limitations of the Auger electron spectroscopy technique are discussed. Applications include simultaneous surface analysis and ion sputtering to produce a compositional-depth profile. This technique is used to study the soldering problem caused by diffusion of impurities to the surface during high temperature treatments. In analyzing wire bond problems, the elemental and chemical bonding information of the Auger signals is shown to provide identification of processing defects.
Keywords
Bonding; Chemical analysis; Electrons; Failure analysis; Impurities; Soldering; Spectroscopy; Sputtering; Surface treatment; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1973. 11th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1973.362593
Filename
4207968
Link To Document