• DocumentCode
    2604104
  • Title

    Failure Analysis Applications of Auger Electron Spectroscopy

  • Author

    Gonzales, Anthony J.

  • Author_Institution
    Section Manager, Motorola, Inc., Materials Research Laboratory, 5005 E. McDowell Road, Phoenix, Arizona 85008
  • fYear
    1973
  • fDate
    26755
  • Firstpage
    185
  • Lastpage
    188
  • Abstract
    The basic operation, advantages, and limitations of the Auger electron spectroscopy technique are discussed. Applications include simultaneous surface analysis and ion sputtering to produce a compositional-depth profile. This technique is used to study the soldering problem caused by diffusion of impurities to the surface during high temperature treatments. In analyzing wire bond problems, the elemental and chemical bonding information of the Auger signals is shown to provide identification of processing defects.
  • Keywords
    Bonding; Chemical analysis; Electrons; Failure analysis; Impurities; Soldering; Spectroscopy; Sputtering; Surface treatment; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1973. 11th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1973.362593
  • Filename
    4207968