• DocumentCode
    2604110
  • Title

    Using WAVES for verification of synthesized sub-components in a deeply hierarchical design

  • Author

    Kadrovach, B. ; Jarusiewic, P. ; Read, B. ; Bishop, R. ; Concha, L. ; Olson, K.

  • Author_Institution
    Res. & Dev. Center, Wright-Patterson AFB, OH, USA
  • fYear
    1997
  • fDate
    19-22, Oct 1997
  • Firstpage
    11
  • Lastpage
    17
  • Abstract
    The Waveform and Vector Exchange Standard (WAVES) and organically developed tools were used in a new testing and verification methodology for an in-house design of a massively parallel graphics accelerator integrated circuit with approximately 700,000 transistors. The purpose of the methodology was to automate as much as possible the functional testing of all implementation levels. WAVES and its associated support tools provide a convenient method to quickly and accurately develop test benches for functional verification in VHDL at all levels. Additional tools were developed in-house to add capabilities for the testing and verification process. These added capabilities made WAVES useful for generating tests for gate and transistor models of the design components
  • Keywords
    automatic testing; computer graphics; digital signal processing chips; formal verification; hardware description languages; integrated circuit testing; parallel architectures; standards; transistors; VHDL; WAVES; Waveform and Vector Exchange Standard; automated functional testing; deeply hierarchical design; design components; functional verification; gate models; massively parallel graphics accelerator integrated circuit; support tools; synthesized sub-components; test generation; testing methodology; transistor models; transistors; verification methodology; Buffer storage; Circuit synthesis; Circuit testing; Decoding; Electromagnetic compatibility; Graphics; Logic; Read-write memory; Shift registers; Tree graphs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VHDL International Users' Forum, 1997. Proceedings
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-8186-8180-2
  • Type

    conf

  • DOI
    10.1109/VIUF.1997.623924
  • Filename
    623924