• DocumentCode
    2604114
  • Title

    Failure Analysis using the Electron Microprobe

  • Author

    Colby, J.W.

  • Author_Institution
    Bell Laboratories, 555 Union Boulevard, Allentown, Pa. 18103
  • fYear
    1973
  • fDate
    26755
  • Firstpage
    189
  • Lastpage
    193
  • Abstract
    The electron microprobe is an extremely useful diagnostic tool. It is capable of performing both qualitative and quantitative analysis, and may also provide information on chemical valence state. The analyses are rapid and nondestructive, and may be obtained on an extremely local scale, typically 1-2 cubic microns.
  • Keywords
    Chemical analysis; EMP radiation effects; Electron beams; Energy resolution; Failure analysis; Optical microscopy; Photonic crystals; Scanning electron microscopy; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1973. 11th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1973.362594
  • Filename
    4207969