DocumentCode :
2604118
Title :
Design of a 1.8V 10bit 300MSPS CMOS digital-to-analog converter with a novel deglitching circuit and inverse thermometer decoder
Author :
Yoo, Yongsang ; Song, Minkyu
Author_Institution :
Dept of Semicond. Sci., Dongguk Univ., Seoul, South Korea
Volume :
2
fYear :
2002
fDate :
2002
Firstpage :
311
Abstract :
In this paper, a 1.8 V 10 bit 300 MSPS CMOS digital-to-analog converter (DAC) is described. The architecture of the D/A converter is based on a current steering 8+2 segmented type, which reduces non-linearity errors and other secondary effects. In order to achieve a high performance D/A converter, a novel current cell with a low spurious deglitching circuit and a novel row/column 4 to 15 inverse thermometer decoder are proposed. To verify the performance, the device is integrated with 0.25 μm CMOS 1-poly 5-metal technology. The effective chip area is 1.56 mm2 and power consumption is about 84 mW at 2.5 V power supply. The simulation and experimental results show that the glitch energy is 0.9 pV×sec at fs=100 MHz, 15 pV×sec at fs=300 MHz in worst case, respectively. Furthermore, both INL and DNL are within ±1.0 LSB, and the SFDR is about 59 dB when the sampling frequency is 300 MHz and output frequency is 3 MHz.
Keywords :
CMOS integrated circuits; SPICE; circuit simulation; current-mode circuits; decoding; digital-analogue conversion; integrated circuit design; integrated circuit measurement; integrated circuit noise; 0.25 micron; 1.8 V; 10 bit; 100 MHz; 2.5 V; 3 MHz; 300 MHz; 84 mW; D/A converters; DNL; INL; SFDR; SPICE; chip power consumption; current cell circuits; current steering segmented type CMOS DAC; digital-to-analog converters; effective chip area; glitch energy; low spurious deglitching circuits; nonlinearity errors; output frequency; power supply voltage; row/column inverse thermometer decoders; sampling frequency; Analog-digital conversion; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS technology; Decoding; Digital-analog conversion; Graphics; Semiconductor device noise; Voltage control; Voltage fluctuations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2002. APCCAS '02. 2002 Asia-Pacific Conference on
Print_ISBN :
0-7803-7690-0
Type :
conf
DOI :
10.1109/APCCAS.2002.1115245
Filename :
1115245
Link To Document :
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