DocumentCode :
2604242
Title :
Impact of PLL 1/f2 and white phase noise in RF bandpass sampling processing
Author :
Lolis, L. ; Pelissier, M. ; Bernier, C. ; Dallet, D. ; Begueret, J.B.
Author_Institution :
Radiofreq. Archit. & Circuits Lab., CEA, Grenoble, France
fYear :
2010
fDate :
20-23 June 2010
Firstpage :
325
Lastpage :
328
Abstract :
This work presents a new method to numerically calculate the signal to jitter distortion ratio (SDjR) for any modulated input which is bandpass sampled in the presence of jitter. The numerical method matches the derived analytical equations. It is shown that the impact of white phase noise depends on the signal center frequency and the sub sampling factor while the impact of correlated jitter depends mostly on the signal center frequency. By separating the impact of both phase noise types on the SDjR, specifications for PLL phase noise are derived for a given sampling frequency.
Keywords :
1/f noise; interference (signal); jitter; phase locked loops; signal sampling; white noise; 1/f2 noise; PLL; RF bandpass sampling processing; correlated jitter; signal to jitter distortion ratio; subsampling factor; white phase noise; Analytical models; Jitter; Mathematical model; Numerical models; Phase locked loops; Phase noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
NEWCAS Conference (NEWCAS), 2010 8th IEEE International
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4244-6806-5
Electronic_ISBN :
978-1-4244-6804-1
Type :
conf
DOI :
10.1109/NEWCAS.2010.5604030
Filename :
5604030
Link To Document :
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