Title :
Fabrication Techniques and Screening Procedures for High Reliability Transferred Electron Diodes
Author :
Walsh, Thomas E.
Author_Institution :
Microwave Technology Center, RCA Electronic Components, 1000 South Second Street, Harrison, New Jersey 07029
Abstract :
Extensive investigation of the fabrication techniques for GaAs transferred electron diodes for CW and pulsed microwave oscillators have resulted in observed MTBF´s in excess of 100,000 hours for properly made devices. Screening controls and an operating temperature criterion have been established for ultrareliable radar transmitter diodes functioning in military environments.
Keywords :
Diodes; Electrons; Fabrication; Gallium arsenide; Microwave devices; Microwave oscillators; Microwave theory and techniques; Radar; Temperature control; Transmitters;
Conference_Titel :
Reliability Physics Symposium, 1973. 11th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1973.362608
