DocumentCode :
2604368
Title :
Pulsed RF Life of an L-Band Power Transistor
Author :
Fischer, Konrad H.
Author_Institution :
Semiconductor Devices & Integrated Electronics Technical Area, US Army Electronics Technolog and Devices Laboratory (ECOM), Fort Monmouth, N.J. 07703
fYear :
1973
fDate :
26755
Firstpage :
293
Lastpage :
300
Abstract :
An accelerated pulsed RF life study of the NSC-2010 L-band power transistor was started to determine suitability for an intended application. The application requires 12.5 W of output power at 1.4 GHz with a collector supply voltage of 28 V. During the study, the RF was pulsed with the pulse width being 1.5 ms, and the duty cycle 50%. Results available indicate that the median life and 0.01 percentile life of the transistor are both greater than the desired life of 1.2 X 106 hours at a junction temperature of 140°C and the electrical conditions indicated above. In addition, the predominant failure mode appears to be emitter-base shorting of the transistor due to the formation of a conductive path between the metalization and the silicon through the dielectric layer.
Keywords :
Acceleration; Dielectrics; L-band; Power generation; Power transistors; Radio frequency; Silicon; Space vector pulse width modulation; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1973. 11th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1973.362610
Filename :
4207985
Link To Document :
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