• DocumentCode
    2604513
  • Title

    Compact Nano-Electro-Mechanical Non-Volatile Memory (NEMory) for 3D Integration

  • Author

    Choi, Woo Young ; Kam, Hei ; Lee, Donovan ; Lai, Joanna ; Liu, Tsu-Jae King

  • Author_Institution
    Univ. of California, Berkeley
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    603
  • Lastpage
    606
  • Abstract
    A new electro-mechanical non-volatile memory (NVM) cell design is proposed and demonstrated for the first time. The fabricated cells operate with relatively low program/erase voltages and large sensing margin. Because only dielectric and metal layers are required, this cell design is suitable for post-CMOS fabrication. As the cell area is reduced, low operating voltages can be maintained by scaling the vertical dimensions of the cell. Nanometer-scale electro-mechanical memory technology is therefore attractive for high-density embedded memory applications.
  • Keywords
    CMOS integrated circuits; nanoelectronics; random-access storage; CMOS fabrication; NEMory; high-density embedded memory applications; nano-electro-mechanical nonvolatile memory; nanometer-scale electro-mechanical memory technology; Circuits; Costs; Dielectrics; Electrodes; Fabrication; Flash memory; Hysteresis; Low voltage; Nonvolatile memory; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2007. IEDM 2007. IEEE International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1507-6
  • Electronic_ISBN
    978-1-4244-1508-3
  • Type

    conf

  • DOI
    10.1109/IEDM.2007.4419011
  • Filename
    4419011