Title : 
Compact Nano-Electro-Mechanical Non-Volatile Memory (NEMory) for 3D Integration
         
        
            Author : 
Choi, Woo Young ; Kam, Hei ; Lee, Donovan ; Lai, Joanna ; Liu, Tsu-Jae King
         
        
            Author_Institution : 
Univ. of California, Berkeley
         
        
        
        
        
        
            Abstract : 
A new electro-mechanical non-volatile memory (NVM) cell design is proposed and demonstrated for the first time. The fabricated cells operate with relatively low program/erase voltages and large sensing margin. Because only dielectric and metal layers are required, this cell design is suitable for post-CMOS fabrication. As the cell area is reduced, low operating voltages can be maintained by scaling the vertical dimensions of the cell. Nanometer-scale electro-mechanical memory technology is therefore attractive for high-density embedded memory applications.
         
        
            Keywords : 
CMOS integrated circuits; nanoelectronics; random-access storage; CMOS fabrication; NEMory; high-density embedded memory applications; nano-electro-mechanical nonvolatile memory; nanometer-scale electro-mechanical memory technology; Circuits; Costs; Dielectrics; Electrodes; Fabrication; Flash memory; Hysteresis; Low voltage; Nonvolatile memory; Tunneling;
         
        
        
        
            Conference_Titel : 
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
         
        
            Conference_Location : 
Washington, DC
         
        
            Print_ISBN : 
978-1-4244-1507-6
         
        
            Electronic_ISBN : 
978-1-4244-1508-3
         
        
        
            DOI : 
10.1109/IEDM.2007.4419011