DocumentCode :
2604513
Title :
Compact Nano-Electro-Mechanical Non-Volatile Memory (NEMory) for 3D Integration
Author :
Choi, Woo Young ; Kam, Hei ; Lee, Donovan ; Lai, Joanna ; Liu, Tsu-Jae King
Author_Institution :
Univ. of California, Berkeley
fYear :
2007
fDate :
10-12 Dec. 2007
Firstpage :
603
Lastpage :
606
Abstract :
A new electro-mechanical non-volatile memory (NVM) cell design is proposed and demonstrated for the first time. The fabricated cells operate with relatively low program/erase voltages and large sensing margin. Because only dielectric and metal layers are required, this cell design is suitable for post-CMOS fabrication. As the cell area is reduced, low operating voltages can be maintained by scaling the vertical dimensions of the cell. Nanometer-scale electro-mechanical memory technology is therefore attractive for high-density embedded memory applications.
Keywords :
CMOS integrated circuits; nanoelectronics; random-access storage; CMOS fabrication; NEMory; high-density embedded memory applications; nano-electro-mechanical nonvolatile memory; nanometer-scale electro-mechanical memory technology; Circuits; Costs; Dielectrics; Electrodes; Fabrication; Flash memory; Hysteresis; Low voltage; Nonvolatile memory; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1507-6
Electronic_ISBN :
978-1-4244-1508-3
Type :
conf
DOI :
10.1109/IEDM.2007.4419011
Filename :
4419011
Link To Document :
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