Title :
Reliability Aspects of Nichrome Fusible Link PROM´s (Progammable Read Only Memories)
Author :
Franklin, Paul ; Burgess, David
Author_Institution :
Monolithic Memories, Inc., Sunnyvale, California
Abstract :
Reliability aspects of nichrome fusible link PROM\´s have been investigated and are defined in the areas of manufacturing, screening, testing and programming. Early mortality failure populations are analyzed and long term life considerations explored, The "grow-back" mechanism, a failure mode involving the relinking of fuses, is characterized and discussed in terms of design, programming, screening, testing and reliability.
Keywords :
Breakdown voltage; Circuit testing; Decoding; Electric breakdown; Fuses; PROM; Packaging; Pins; Read only memory; Temperature;
Conference_Titel :
Reliability Physics Symposium, 1974. 12th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1974.362631
