Title :
Device/Circuit Interactions in Highly-Scaled CMOS: Challenges and Potential Solutions
Author_Institution :
Texas Instruments Deutschland GmbH
Keywords :
CMOS logic circuits; CMOS technology; Circuit synthesis; Circuits and systems; Instruments; Logic devices; MOSFET circuits; Manufacturing industries;
Conference_Titel :
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1507-6
Electronic_ISBN :
978-1-4244-1508-3
DOI :
10.1109/IEDM.2007.4419021
