DocumentCode :
2604758
Title :
Median-Time-to-Failure (MTF) of an L-Band Power Transistor Under RF Conditions
Author :
Poole, Walter E. ; Walshak, Louis G.
Author_Institution :
Microwave Semiconductor Corp., Somerset, New Jersey
fYear :
1974
fDate :
27120
Firstpage :
109
Lastpage :
117
Keywords :
L-band; Life testing; Phased arrays; Power system reliability; Power transistors; Pulse amplifiers; Pulse measurements; Radio frequency; System testing; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1974. 12th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1974.362637
Filename :
4208015
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2604758
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