Title :
The effects of edge defects on the switching characteristics of bit patterned media
Author :
Chunsheng, E. ; Parekh, Vishal ; Rantschler, James O. ; Ruchhoeft, Paul ; Khizroev, Sakhrat ; Litvinov, Dmitri
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Houston, Houston, TX
Abstract :
We present the results of micromagnetic studies on realistic patterning defects in perpendicularly oriented magnetic thin films. Both undercut and line edge roughness are investigated systematically with simulations using simple test structures to see the effect of the side wall angle, the roughness amplitude on a nanostructureiquests switching field, and the roughness period on mathematically tractable figures. We then run simulations of hysteresis loops of actual 200 nm diameter nanostructures using AFM images to define the structure boundary and compare the results to MFM images of DC demagnetized dots.
Keywords :
atomic force microscopy; magnetic force microscopy; magnetic hysteresis; magnetic recording; magnetic switching; magnetic thin films; nanopatterning; nanostructured materials; surface roughness; atomic force microscopy; bit patterned media; edge defects; hysteresis loops; magnetic force microscopy; magnetic thin films; micromagnetic studies; nanostructure; patterning defects; roughness amplitude; side wall angle; switching characteristics; Coercive force; Magnetic films; Magnetic force microscopy; Magnetic hysteresis; Magnetic switching; Micromagnetics; Nanostructures; Object oriented modeling; Perpendicular magnetic recording; Testing;
Conference_Titel :
Nanotechnology, 2007. IEEE-NANO 2007. 7th IEEE Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-0607-4
Electronic_ISBN :
978-1-4244-0608-1
DOI :
10.1109/NANO.2007.4601220
