Title :
First IC validation of IEEE Std. 1149.6
Author :
Vandivier, Suzette ; Wahl, Mark ; Rearick, Jeff
Author_Institution :
Agilent Technol., Ft. Collins, CO, USA
fDate :
30 Sept.-2 Oct. 2003
Abstract :
This paper provides proof of concept for the newly-approved 1149.6 standard by investigating the first silicon implementation of the test receiver. EXTEST and EXTEST_PULSE tests were applied to functional channels as well as channels with a set of externally-induced hard defects. All valid signals were correctly received, and all defects were detected, thus validating both 1149.6´s anticipated backwards compatibility with 1149.1 and fault coverage. Mission-mode tests showed no performance degradation due to the test circuits. Characterization across PVT of the test receiver suggests 1149.6´s robustness with respect to noise.
Keywords :
IEEE standards; integrated circuit testing; logic testing; EXTEST; EXTEST_PULSE tests; IC validation; IEEE Std. 1149.6; externally-induced hard defects; fault coverage; functional channels; mission-mode tests; test circuits; test receiver; Circuit faults; Circuit testing; Integrated circuit testing; Logic testing; Noise robustness; Performance evaluation; Pins; Signal design; Timing; Voltage;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271197
